Scanning Electron Microscopy

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Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
  • ISBN - 9783540639763
  • Oprawa - twarda
  • Ilość stron - 529

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Scanning Electron Microscopy 1538.82 DO SKLEPU
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
  • ISBN - 9783540639763
  • Oprawa - twarda
  • Ilość stron - 529
  • Rok wydania - 1998